- Potential Induced Degradation (PID) is one of the severe failure modes observed in the field with high system voltage, high humidity, and high operating temperature.
- The PV module needs to be tested for PID susceptibility as per site conditions before installation in the field.
- This study analysed the effect of temperature, humidity, and voltage on leakage current and PID for crystalline silicon module technologies.
- The effect of PID stress on PV modules in terms of electrical degradation and visual defects was also analysed.
- Test procedure: SNI IEC TS 62804-1 - Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation – Part 1: Crystalline silicon
